Can you trust storage devices SMART data?

Post date: Dec 14, 2015 3:53:38 AM

Introduction

A sad state of consumer hard drives. This drive is OK says the SMART data. But when doing further testing results are like. Proper testing of drive took about 30 hours. Even the extended self-test takes 112 minutes, yet that only test reading of the drive. It doesn't do patterned write-read test for every block repeatedly. Read errors, but drive still officially passes as healthy drive. Here's a good example. Everyone claimed that there's nothing wrong with the drive. After proper patterned testing of 26 hours result was clear, 311 bad sectors which couldn't be remapped properly by drive. Actually after collecting data for this post, I've had two similar cases. In one case it was Western Digital drive and in one a Seagate. But the end result was same. PASSED yet broken. Just if you didn't know - In some cases there are repeated read write errors, yet those sectors won't get remapped and in some cases even won't get listed at pending sectors.

Full SMART before testing

smartctl 6.4 2014-10-07 r4002 [i686-linux-3.19.0-15-generic] (local build)

=== START OF INFORMATION SECTION ===

Device Model: TOSHIBA MQ01ABD050V -63

Serial Number: 93DXC00KT

LU WWN Device Id: 5 000039 5043047a1

Firmware Version: AX0A1Q

User Capacity: 500,107,862,016 bytes [500 GB]

Sector Sizes: 512 bytes logical, 4096 bytes physical

Rotation Rate: 5400 rpm

Form Factor: 2.5 inches

Device is: Not in smartctl database [for details use: -P showall]

ATA Version is: ATA8-ACS (minor revision not indicated)

SATA Version is: SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s)

Local Time is: Wed Dec 2 05:55:35 2015 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever

been run.

Total time to complete Offline

data collection: ( 120) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 112) minutes.

SCT capabilities: (0x003d) SCT Status supported.

SCT Error Recovery Control supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0

3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1093

4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 24

5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 40

7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0

9 Power_On_Hours 0x0032 068 068 000 Old_age Always - 12891

10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0

12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 24

191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 3

192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 14

193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 11910

194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 27 (Min/Max 22/53)

196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 5

197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 2504

198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0

199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0

220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0

222 Loaded_Hours 0x0032 088 088 000 Old_age Always - 5101

223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0

224 Load_Friction 0x0022 100 100 000 Old_age Always - 0

226 Load-in_Time 0x0026 100 100 000 Old_age Always - 205

240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0

SMART Error Log Version: 1

ATA Error Count: 10 (device log contains only the most recent five errors)

CR = Command Register [HEX]

FR = Features Register [HEX]

SC = Sector Count Register [HEX]

SN = Sector Number Register [HEX]

CL = Cylinder Low Register [HEX]

CH = Cylinder High Register [HEX]

DH = Device/Head Register [HEX]

DC = Device Command Register [HEX]

ER = Error register [HEX]

ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 10 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 00 a8 d3 01 e0 Error: UNC at LBA = 0x0001d3a8 = 119720

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 00 a8 d3 01 e0 00 9d+04:32:22.369 READ DMA

25 00 08 d0 b9 36 e0 00 9d+04:32:22.368 READ DMA EXT

25 00 08 d8 b9 36 e0 00 9d+04:32:22.367 READ DMA EXT

25 00 08 e0 b9 36 e0 00 9d+04:32:22.342 READ DMA EXT

c8 00 08 00 e4 01 e0 00 9d+04:32:22.341 READ DMA

Error 9 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 10 58 d3 01 e0 Error: UNC 16 sectors at LBA = 0x0001d358 = 119640

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 20 48 d3 01 e0 00 9d+04:32:18.697 READ DMA

c8 00 08 48 00 00 e8 00 9d+04:32:18.672 READ DMA

c8 00 18 a8 00 00 e0 00 9d+04:32:18.671 READ DMA

c8 00 08 e8 d2 01 e0 00 9d+04:32:18.671 READ DMA

c8 00 08 c0 00 00 e0 00 9d+04:32:18.670 READ DMA

Error 8 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 e0 e0 d3 01 e0 Error: UNC 224 sectors at LBA = 0x0001d3e0 = 119776

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 f0 d0 d3 01 e0 00 9d+04:30:43.223 READ DMA

c8 00 30 c8 d2 01 e0 00 9d+04:30:43.222 READ DMA

c8 00 08 c0 d2 01 e0 00 9d+04:30:43.222 READ DMA

ca 00 00 e8 7e 01 e0 00 9d+04:30:41.676 WRITE DMA

ca 00 00 e8 7d 01 e0 00 9d+04:30:41.674 WRITE DMA

Error 7 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 28 a8 d3 01 e0 Error: UNC 40 sectors at LBA = 0x0001d3a8 = 119720

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 60 70 d3 01 e0 00 9d+04:28:55.917 READ DMA

c8 00 08 88 00 00 e0 00 9d+04:28:55.901 READ DMA

25 00 40 60 00 00 e0 00 9d+04:28:55.873 READ DMA EXT

25 00 80 60 01 80 e0 00 9d+04:28:55.835 READ DMA EXT

25 00 00 60 00 80 e0 00 9d+04:28:55.823 READ DMA EXT

Error 6 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 20 40 e0 01 e0 Error: UNC 32 sectors at LBA = 0x0001e040 = 122944

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 38 28 e0 01 e0 00 9d+04:28:34.531 READ DMA

c8 00 08 20 e0 01 e0 00 9d+04:28:32.890 READ DMA

35 00 00 28 2c 34 e0 00 9d+04:28:32.889 WRITE DMA EXT

35 00 00 28 2b 34 e0 00 9d+04:28:32.887 WRITE DMA EXT

35 00 00 28 2a 34 e0 00 9d+04:28:32.885 WRITE DMA EXT

SMART Self-test log structure revision number 1

No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

Note that there are already uncorrectable errors, yet drive is healthy.

SMART after full extended self test.

smartctl 6.4 2014-10-07 r4002 [i686-linux-3.19.0-15-generic] (local build)

=== START OF INFORMATION SECTION ===

Device Model: TOSHIBA MQ01ABD050V -63

Serial Number: 93DXC00KT

LU WWN Device Id: 5 000039 5043047a1

Firmware Version: AX0A1Q

User Capacity: 500,107,862,016 bytes [500 GB]

Sector Sizes: 512 bytes logical, 4096 bytes physical

Rotation Rate: 5400 rpm

Form Factor: 2.5 inches

Device is: Not in smartctl database [for details use: -P showall]

ATA Version is: ATA8-ACS (minor revision not indicated)

SATA Version is: SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s)

Local Time is: Wed Dec 2 08:28:30 2015 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 112) The previous self-test completed having

the read element of the test failed.

Total time to complete Offline

data collection: ( 120) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 112) minutes.

SCT capabilities: (0x003d) SCT Status supported.

SCT Error Recovery Control supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0

3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1093

4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 24

5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 40

7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0

9 Power_On_Hours 0x0032 068 068 000 Old_age Always - 12894

10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0

12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 24

191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 3

192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 14

193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 11911

194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 30 (Min/Max 22/53)

196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 5

197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 2488

198 Offline_Uncorrectable 0x0030 001 001 000 Old_age Offline - 255

199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0

220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0

222 Loaded_Hours 0x0032 088 088 000 Old_age Always - 5103

223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0

224 Load_Friction 0x0022 100 100 000 Old_age Always - 0

226 Load-in_Time 0x0026 100 100 000 Old_age Always - 264

240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0

SMART Error Log Version: 1

ATA Error Count: 10 (device log contains only the most recent five errors)

CR = Command Register [HEX]

FR = Features Register [HEX]

SC = Sector Count Register [HEX]

SN = Sector Number Register [HEX]

CL = Cylinder Low Register [HEX]

CH = Cylinder High Register [HEX]

DH = Device/Head Register [HEX]

DC = Device Command Register [HEX]

ER = Error register [HEX]

ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 10 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 00 a8 d3 01 e0 Error: UNC at LBA = 0x0001d3a8 = 119720

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 00 a8 d3 01 e0 00 9d+04:32:22.369 READ DMA

25 00 08 d0 b9 36 e0 00 9d+04:32:22.368 READ DMA EXT

25 00 08 d8 b9 36 e0 00 9d+04:32:22.367 READ DMA EXT

25 00 08 e0 b9 36 e0 00 9d+04:32:22.342 READ DMA EXT

c8 00 08 00 e4 01 e0 00 9d+04:32:22.341 READ DMA

Error 9 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 10 58 d3 01 e0 Error: UNC 16 sectors at LBA = 0x0001d358 = 119640

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 20 48 d3 01 e0 00 9d+04:32:18.697 READ DMA

c8 00 08 48 00 00 e8 00 9d+04:32:18.672 READ DMA

c8 00 18 a8 00 00 e0 00 9d+04:32:18.671 READ DMA

c8 00 08 e8 d2 01 e0 00 9d+04:32:18.671 READ DMA

c8 00 08 c0 00 00 e0 00 9d+04:32:18.670 READ DMA

Error 8 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 e0 e0 d3 01 e0 Error: UNC 224 sectors at LBA = 0x0001d3e0 = 119776

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 f0 d0 d3 01 e0 00 9d+04:30:43.223 READ DMA

c8 00 30 c8 d2 01 e0 00 9d+04:30:43.222 READ DMA

c8 00 08 c0 d2 01 e0 00 9d+04:30:43.222 READ DMA

ca 00 00 e8 7e 01 e0 00 9d+04:30:41.676 WRITE DMA

ca 00 00 e8 7d 01 e0 00 9d+04:30:41.674 WRITE DMA

Error 7 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 28 a8 d3 01 e0 Error: UNC 40 sectors at LBA = 0x0001d3a8 = 119720

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 60 70 d3 01 e0 00 9d+04:28:55.917 READ DMA

c8 00 08 88 00 00 e0 00 9d+04:28:55.901 READ DMA

25 00 40 60 00 00 e0 00 9d+04:28:55.873 READ DMA EXT

25 00 80 60 01 80 e0 00 9d+04:28:55.835 READ DMA EXT

25 00 00 60 00 80 e0 00 9d+04:28:55.823 READ DMA EXT

Error 6 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 20 40 e0 01 e0 Error: UNC 32 sectors at LBA = 0x0001e040 = 122944

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

c8 00 38 28 e0 01 e0 00 9d+04:28:34.531 READ DMA

c8 00 08 20 e0 01 e0 00 9d+04:28:32.890 READ DMA

35 00 00 28 2c 34 e0 00 9d+04:28:32.889 WRITE DMA EXT

35 00 00 28 2b 34 e0 00 9d+04:28:32.887 WRITE DMA EXT

35 00 00 28 2a 34 e0 00 9d+04:28:32.885 WRITE DMA EXT

SMART Self-test log structure revision number 1

Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error

# 1 Extended captive Completed: read failure 00% 12893 119720

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

As you can see, self test ended with read failure, yet the drive is still healthy.

Smart data after proper patterned read write testing for 26 hours

smartctl 6.4 2014-10-07 r4002 [i686-linux-3.19.0-15-generic] (local build)

=== START OF INFORMATION SECTION ===

Device Model: TOSHIBA MQ01ABD050V -63

Serial Number: 93DXC00KT

LU WWN Device Id: 5 000039 5043047a1

Firmware Version: AX0A1Q

User Capacity: 500,107,862,016 bytes [500 GB]

Sector Sizes: 512 bytes logical, 4096 bytes physical

Rotation Rate: 5400 rpm

Form Factor: 2.5 inches

Device is: Not in smartctl database [for details use: -P showall]

ATA Version is: ATA8-ACS (minor revision not indicated)

SATA Version is: SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s)

Local Time is: Thu Dec 3 10:42:58 2015 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 112) The previous self-test completed having

the read element of the test failed.

Total time to complete Offline

data collection: ( 120) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 112) minutes.

SCT capabilities: (0x003d) SCT Status supported.

SCT Error Recovery Control supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0

3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1093

4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 24

5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 40

7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0

9 Power_On_Hours 0x0032 068 068 000 Old_age Always - 12920

10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0

12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 24

191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 3

192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 14

193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 11911

194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 34 (Min/Max 22/53)

196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 5

197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 2488

198 Offline_Uncorrectable 0x0030 001 001 000 Old_age Offline - 255

199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0

220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0

222 Loaded_Hours 0x0032 088 088 000 Old_age Always - 5129

223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0

224 Load_Friction 0x0022 100 100 000 Old_age Always - 0

226 Load-in_Time 0x0026 100 100 000 Old_age Always - 264

240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0

SMART Error Log Version: 1

ATA Error Count: 346 (device log contains only the most recent five errors)

CR = Command Register [HEX]

FR = Features Register [HEX]

SC = Sector Count Register [HEX]

SN = Sector Number Register [HEX]

CL = Cylinder Low Register [HEX]

CH = Cylinder High Register [HEX]

DH = Device/Head Register [HEX]

DC = Device Command Register [HEX]

ER = Error register [HEX]

ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as

DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,

SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 346 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 08 f0 3c 8c ee Error: UNC 8 sectors at LBA = 0x0e8c3cf0 = 244071664

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 08 f0 3c 8c e0 00 09:17:05.836 READ DMA EXT

25 00 08 e8 3c 8c e0 00 09:17:02.470 READ DMA EXT

25 00 08 e0 3c 8c e0 00 09:16:59.084 READ DMA EXT

35 00 08 d8 3c 8c e0 00 09:16:59.083 WRITE DMA EXT

25 00 08 d8 3c 8c e0 00 09:16:59.082 READ DMA EXT

Error 345 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 08 e8 3c 8c ee Error: UNC 8 sectors at LBA = 0x0e8c3ce8 = 244071656

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 08 e8 3c 8c e0 00 09:17:02.470 READ DMA EXT

25 00 08 e0 3c 8c e0 00 09:16:59.084 READ DMA EXT

35 00 08 d8 3c 8c e0 00 09:16:59.083 WRITE DMA EXT

25 00 08 d8 3c 8c e0 00 09:16:59.082 READ DMA EXT

35 00 08 d8 3c 8c e0 00 09:16:59.071 WRITE DMA EXT

Error 344 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 08 e0 3c 8c ee Error: UNC 8 sectors at LBA = 0x0e8c3ce0 = 244071648

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 08 e0 3c 8c e0 00 09:16:59.084 READ DMA EXT

35 00 08 d8 3c 8c e0 00 09:16:59.083 WRITE DMA EXT

25 00 08 d8 3c 8c e0 00 09:16:59.082 READ DMA EXT

35 00 08 d8 3c 8c e0 00 09:16:59.071 WRITE DMA EXT

25 00 08 d8 3c 8c e0 00 09:16:59.062 READ DMA EXT

Error 343 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 08 c0 3c 8c ee Error: UNC 8 sectors at LBA = 0x0e8c3cc0 = 244071616

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 08 c0 3c 8c e0 00 09:16:55.625 READ DMA EXT

25 00 08 b8 3c 8c e0 00 09:16:52.247 READ DMA EXT

25 00 08 b0 3c 8c e0 00 09:16:48.850 READ DMA EXT

35 00 08 a8 3c 8c e0 00 09:16:48.849 WRITE DMA EXT

25 00 08 a8 3c 8c e0 00 09:16:48.848 READ DMA EXT

Error 342 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

40 51 08 b8 3c 8c ee Error: UNC 8 sectors at LBA = 0x0e8c3cb8 = 244071608

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

25 00 08 b8 3c 8c e0 00 09:16:52.247 READ DMA EXT

25 00 08 b0 3c 8c e0 00 09:16:48.850 READ DMA EXT

35 00 08 a8 3c 8c e0 00 09:16:48.849 WRITE DMA EXT

25 00 08 a8 3c 8c e0 00 09:16:48.848 READ DMA EXT

35 00 08 a8 3c 8c e0 00 09:16:48.838 WRITE DMA EXT

SMART Self-test log structure revision number 1

Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error

# 1 Extended captive Completed: read failure 00% 12893 119720

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

Final conclusion

As you can see, there are more errors, actually the drive has two error 'groups'. Even after this the drive is still healthy. There's no error or problem, we just can't read or write some data.

Can you trust SMART? - No. Does the self-test properly test drive? - No. Ok, no news. This was just another data storage case as usual.