Blog‎ > ‎

Can you trust storage devices SMART data?

posted Dec 13, 2015, 7:53 PM by Sami Lehtinen   [ updated Dec 13, 2015, 7:56 PM ]

Introduction

A sad state of consumer hard drives. This drive is OK says the SMART  data. But when doing further testing results are like. Proper testing of drive took about 30 hours. Even the extended self-test takes 112 minutes, yet that only test reading of the drive. It doesn't do patterned write-read test for every block repeatedly. Read errors, but drive still officially passes as healthy drive. Here's a good example. Everyone claimed that there's nothing wrong with the drive. After proper patterned testing of 26 hours result was clear, 311 bad sectors which couldn't be remapped properly by drive. Actually after collecting data for this post, I've had two similar cases. In one case it was Western Digital drive and in one a Seagate. But the end result was same. PASSED yet broken. Just if you didn't know - In some cases there are repeated read write errors, yet those sectors won't get remapped and in some cases even won't get listed at pending sectors.

Full SMART before testing

smartctl 6.4 2014-10-07 r4002 [i686-linux-3.19.0-15-generic] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
 
=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA MQ01ABD050V -63
Serial Number:    93DXC00KT
LU WWN Device Id: 5 000039 5043047a1
Firmware Version: AX0A1Q
User Capacity:    500,107,862,016 bytes [500 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA8-ACS (minor revision not indicated)
SATA Version is:  SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s)
Local Time is:    Wed Dec  2 05:55:35 2015 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
 
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
 
General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:         (  120) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 112) minutes.
SCT capabilities:            (0x003d)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.
 
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       1093
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       24
  5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always       -       40
  7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   068   068   000    Old_age   Always       -       12891
 10 Spin_Retry_Count        0x0033   100   100   030    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       24
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       3
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       14
193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       11910
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       27 (Min/Max 22/53)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       5
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       2504
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
220 Disk_Shift              0x0002   100   100   000    Old_age   Always       -       0
222 Loaded_Hours            0x0032   088   088   000    Old_age   Always       -       5101
223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
224 Load_Friction           0x0022   100   100   000    Old_age   Always       -       0
226 Load-in_Time            0x0026   100   100   000    Old_age   Always       -       205
240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline      -       0
 
SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
 
Error 10 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 a8 d3 01 e0  Error: UNC at LBA = 0x0001d3a8 = 119720
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 a8 d3 01 e0 00   9d+04:32:22.369  READ DMA
  25 00 08 d0 b9 36 e0 00   9d+04:32:22.368  READ DMA EXT
  25 00 08 d8 b9 36 e0 00   9d+04:32:22.367  READ DMA EXT
  25 00 08 e0 b9 36 e0 00   9d+04:32:22.342  READ DMA EXT
  c8 00 08 00 e4 01 e0 00   9d+04:32:22.341  READ DMA
 
Error 9 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 58 d3 01 e0  Error: UNC 16 sectors at LBA = 0x0001d358 = 119640
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 20 48 d3 01 e0 00   9d+04:32:18.697  READ DMA
  c8 00 08 48 00 00 e8 00   9d+04:32:18.672  READ DMA
  c8 00 18 a8 00 00 e0 00   9d+04:32:18.671  READ DMA
  c8 00 08 e8 d2 01 e0 00   9d+04:32:18.671  READ DMA
  c8 00 08 c0 00 00 e0 00   9d+04:32:18.670  READ DMA
 
Error 8 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 e0 e0 d3 01 e0  Error: UNC 224 sectors at LBA = 0x0001d3e0 = 119776
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 f0 d0 d3 01 e0 00   9d+04:30:43.223  READ DMA
  c8 00 30 c8 d2 01 e0 00   9d+04:30:43.222  READ DMA
  c8 00 08 c0 d2 01 e0 00   9d+04:30:43.222  READ DMA
  ca 00 00 e8 7e 01 e0 00   9d+04:30:41.676  WRITE DMA
  ca 00 00 e8 7d 01 e0 00   9d+04:30:41.674  WRITE DMA
 
Error 7 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 28 a8 d3 01 e0  Error: UNC 40 sectors at LBA = 0x0001d3a8 = 119720
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 60 70 d3 01 e0 00   9d+04:28:55.917  READ DMA
  c8 00 08 88 00 00 e0 00   9d+04:28:55.901  READ DMA
  25 00 40 60 00 00 e0 00   9d+04:28:55.873  READ DMA EXT
  25 00 80 60 01 80 e0 00   9d+04:28:55.835  READ DMA EXT
  25 00 00 60 00 80 e0 00   9d+04:28:55.823  READ DMA EXT
 
Error 6 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 20 40 e0 01 e0  Error: UNC 32 sectors at LBA = 0x0001e040 = 122944
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 38 28 e0 01 e0 00   9d+04:28:34.531  READ DMA
  c8 00 08 20 e0 01 e0 00   9d+04:28:32.890  READ DMA
  35 00 00 28 2c 34 e0 00   9d+04:28:32.889  WRITE DMA EXT
  35 00 00 28 2b 34 e0 00   9d+04:28:32.887  WRITE DMA EXT
  35 00 00 28 2a 34 e0 00   9d+04:28:32.885  WRITE DMA EXT
 
SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]
 
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Note that there are already uncorrectable errors, yet drive is healthy.

SMART after full extended self test.

smartctl 6.4 2014-10-07 r4002 [i686-linux-3.19.0-15-generic] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
 
=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA MQ01ABD050V -63
Serial Number:    93DXC00KT
LU WWN Device Id: 5 000039 5043047a1
Firmware Version: AX0A1Q
User Capacity:    500,107,862,016 bytes [500 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA8-ACS (minor revision not indicated)
SATA Version is:  SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s)
Local Time is:    Wed Dec  2 08:28:30 2015 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
 
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
 
General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 112)    The previous self-test completed having
                    the read element of the test failed.
Total time to complete Offline 
data collection:         (  120) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 112) minutes.
SCT capabilities:            (0x003d)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.
 
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       1093
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       24
  5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always       -       40
  7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   068   068   000    Old_age   Always       -       12894
 10 Spin_Retry_Count        0x0033   100   100   030    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       24
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       3
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       14
193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       11911
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       30 (Min/Max 22/53)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       5
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       2488
198 Offline_Uncorrectable   0x0030   001   001   000    Old_age   Offline      -       255
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
220 Disk_Shift              0x0002   100   100   000    Old_age   Always       -       0
222 Loaded_Hours            0x0032   088   088   000    Old_age   Always       -       5103
223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
224 Load_Friction           0x0022   100   100   000    Old_age   Always       -       0
226 Load-in_Time            0x0026   100   100   000    Old_age   Always       -       264
240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline      -       0
 
SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
 
Error 10 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 a8 d3 01 e0  Error: UNC at LBA = 0x0001d3a8 = 119720
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 00 a8 d3 01 e0 00   9d+04:32:22.369  READ DMA
  25 00 08 d0 b9 36 e0 00   9d+04:32:22.368  READ DMA EXT
  25 00 08 d8 b9 36 e0 00   9d+04:32:22.367  READ DMA EXT
  25 00 08 e0 b9 36 e0 00   9d+04:32:22.342  READ DMA EXT
  c8 00 08 00 e4 01 e0 00   9d+04:32:22.341  READ DMA
 
Error 9 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 10 58 d3 01 e0  Error: UNC 16 sectors at LBA = 0x0001d358 = 119640
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 20 48 d3 01 e0 00   9d+04:32:18.697  READ DMA
  c8 00 08 48 00 00 e8 00   9d+04:32:18.672  READ DMA
  c8 00 18 a8 00 00 e0 00   9d+04:32:18.671  READ DMA
  c8 00 08 e8 d2 01 e0 00   9d+04:32:18.671  READ DMA
  c8 00 08 c0 00 00 e0 00   9d+04:32:18.670  READ DMA
 
Error 8 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 e0 e0 d3 01 e0  Error: UNC 224 sectors at LBA = 0x0001d3e0 = 119776
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 f0 d0 d3 01 e0 00   9d+04:30:43.223  READ DMA
  c8 00 30 c8 d2 01 e0 00   9d+04:30:43.222  READ DMA
  c8 00 08 c0 d2 01 e0 00   9d+04:30:43.222  READ DMA
  ca 00 00 e8 7e 01 e0 00   9d+04:30:41.676  WRITE DMA
  ca 00 00 e8 7d 01 e0 00   9d+04:30:41.674  WRITE DMA
 
Error 7 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 28 a8 d3 01 e0  Error: UNC 40 sectors at LBA = 0x0001d3a8 = 119720
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 60 70 d3 01 e0 00   9d+04:28:55.917  READ DMA
  c8 00 08 88 00 00 e0 00   9d+04:28:55.901  READ DMA
  25 00 40 60 00 00 e0 00   9d+04:28:55.873  READ DMA EXT
  25 00 80 60 01 80 e0 00   9d+04:28:55.835  READ DMA EXT
  25 00 00 60 00 80 e0 00   9d+04:28:55.823  READ DMA EXT
 
Error 6 occurred at disk power-on lifetime: 12837 hours (534 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 20 40 e0 01 e0  Error: UNC 32 sectors at LBA = 0x0001e040 = 122944
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 38 28 e0 01 e0 00   9d+04:28:34.531  READ DMA
  c8 00 08 20 e0 01 e0 00   9d+04:28:32.890  READ DMA
  35 00 00 28 2c 34 e0 00   9d+04:28:32.889  WRITE DMA EXT
  35 00 00 28 2b 34 e0 00   9d+04:28:32.887  WRITE DMA EXT
  35 00 00 28 2a 34 e0 00   9d+04:28:32.885  WRITE DMA EXT
 
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended captive    Completed: read failure       00%     12893         119720
 
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 
As you can see, self test ended with read failure, yet the drive is still healthy. 

Smart data after proper patterned read write testing for 26 hours

smartctl 6.4 2014-10-07 r4002 [i686-linux-3.19.0-15-generic] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
 
=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA MQ01ABD050V -63
Serial Number:    93DXC00KT
LU WWN Device Id: 5 000039 5043047a1
Firmware Version: AX0A1Q
User Capacity:    500,107,862,016 bytes [500 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA8-ACS (minor revision not indicated)
SATA Version is:  SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s)
Local Time is:    Thu Dec  3 10:42:58 2015 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
 
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
 
General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 112)    The previous self-test completed having
                    the read element of the test failed.
Total time to complete Offline 
data collection:         (  120) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 112) minutes.
SCT capabilities:            (0x003d)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.
 
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       1093
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       24
  5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always       -       40
  7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   068   068   000    Old_age   Always       -       12920
 10 Spin_Retry_Count        0x0033   100   100   030    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       24
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       3
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       14
193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       11911
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       34 (Min/Max 22/53)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       5
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       2488
198 Offline_Uncorrectable   0x0030   001   001   000    Old_age   Offline      -       255
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
220 Disk_Shift              0x0002   100   100   000    Old_age   Always       -       0
222 Loaded_Hours            0x0032   088   088   000    Old_age   Always       -       5129
223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
224 Load_Friction           0x0022   100   100   000    Old_age   Always       -       0
226 Load-in_Time            0x0026   100   100   000    Old_age   Always       -       264
240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline      -       0
 
SMART Error Log Version: 1
ATA Error Count: 346 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
 
Error 346 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 f0 3c 8c ee  Error: UNC 8 sectors at LBA = 0x0e8c3cf0 = 244071664
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 f0 3c 8c e0 00      09:17:05.836  READ DMA EXT
  25 00 08 e8 3c 8c e0 00      09:17:02.470  READ DMA EXT
  25 00 08 e0 3c 8c e0 00      09:16:59.084  READ DMA EXT
  35 00 08 d8 3c 8c e0 00      09:16:59.083  WRITE DMA EXT
  25 00 08 d8 3c 8c e0 00      09:16:59.082  READ DMA EXT
 
Error 345 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 e8 3c 8c ee  Error: UNC 8 sectors at LBA = 0x0e8c3ce8 = 244071656
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 e8 3c 8c e0 00      09:17:02.470  READ DMA EXT
  25 00 08 e0 3c 8c e0 00      09:16:59.084  READ DMA EXT
  35 00 08 d8 3c 8c e0 00      09:16:59.083  WRITE DMA EXT
  25 00 08 d8 3c 8c e0 00      09:16:59.082  READ DMA EXT
  35 00 08 d8 3c 8c e0 00      09:16:59.071  WRITE DMA EXT
 
Error 344 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 e0 3c 8c ee  Error: UNC 8 sectors at LBA = 0x0e8c3ce0 = 244071648
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 e0 3c 8c e0 00      09:16:59.084  READ DMA EXT
  35 00 08 d8 3c 8c e0 00      09:16:59.083  WRITE DMA EXT
  25 00 08 d8 3c 8c e0 00      09:16:59.082  READ DMA EXT
  35 00 08 d8 3c 8c e0 00      09:16:59.071  WRITE DMA EXT
  25 00 08 d8 3c 8c e0 00      09:16:59.062  READ DMA EXT
 
Error 343 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 c0 3c 8c ee  Error: UNC 8 sectors at LBA = 0x0e8c3cc0 = 244071616
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 c0 3c 8c e0 00      09:16:55.625  READ DMA EXT
  25 00 08 b8 3c 8c e0 00      09:16:52.247  READ DMA EXT
  25 00 08 b0 3c 8c e0 00      09:16:48.850  READ DMA EXT
  35 00 08 a8 3c 8c e0 00      09:16:48.849  WRITE DMA EXT
  25 00 08 a8 3c 8c e0 00      09:16:48.848  READ DMA EXT
 
Error 342 occurred at disk power-on lifetime: 12901 hours (537 days + 13 hours)
  When the command that caused the error occurred, the device was active or idle.
 
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 b8 3c 8c ee  Error: UNC 8 sectors at LBA = 0x0e8c3cb8 = 244071608
 
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 08 b8 3c 8c e0 00      09:16:52.247  READ DMA EXT
  25 00 08 b0 3c 8c e0 00      09:16:48.850  READ DMA EXT
  35 00 08 a8 3c 8c e0 00      09:16:48.849  WRITE DMA EXT
  25 00 08 a8 3c 8c e0 00      09:16:48.848  READ DMA EXT
  35 00 08 a8 3c 8c e0 00      09:16:48.838  WRITE DMA EXT
 
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended captive    Completed: read failure       00%     12893         119720
 
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Final conclusion

As you can see, there are more errors, actually the drive has two error 'groups'. Even after this the drive is still healthy. There's no error or problem, we just can't read or write some data.
Can you trust SMART? - No. Does the self-test properly test drive? - No. Ok, no news. This was just another data storage case as usual.